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Research Paper Detail

Degradation effect of Auger recombination and built-in polarization field on GaN-based light-emitting diodes

Publisher: AIP Advances
Publication Year: 2018

First Author:  Muhammad Usman Second Author:  Nazeer Muhammad
Third Author:  Kiran Saba, Dong-Pyo Han, Shabieh Farwa, Muhammad Rafiq, and Tanzila Saba Volume:  8
Publication #:  1 Page #:  NULL
Level:   International Type:  Journal
Email:  rafiq@ciitwah.edu.pk
Muhammad Rafiq

HoD / Associate Professor
Mathematics Department
Wah Campus

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